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Mapping of CMOS FET degradation in bias space – Application to DRAM peripheral devices

dc.contributor.authorKaczer, Ben
dc.contributor.authorFranco, Jacopo
dc.contributor.authorTyaginov, S. E.
dc.contributor.authorJech, M.
dc.contributor.authorRzepa, G.
dc.contributor.authorGrasser, T.
dc.contributor.authorO'Sullivan, Barry
dc.contributor.authorRitzenthaler, Romain
dc.contributor.authorSchram, Tom
dc.contributor.authorSpessot, Alessio
dc.contributor.authorLinten, Dimitri
dc.contributor.authorHoriguchi, Naoto
dc.date.accessioned2021-10-24T06:28:08Z
dc.date.available2021-10-24T06:28:08Z
dc.date.issued2017
dc.identifier.issn1071-1023
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/28617
dc.sourceIIOimport
dc.titleMapping of CMOS FET degradation in bias space – Application to DRAM peripheral devices
dc.typeJournal article
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorO'Sullivan, Barry
dc.contributor.imecauthorRitzenthaler, Romain
dc.contributor.imecauthorSchram, Tom
dc.contributor.imecauthorSpessot, Alessio
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorHoriguchi, Naoto
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecO'Sullivan, Barry::0000-0002-9036-8241
dc.contributor.orcidimecRitzenthaler, Romain::0000-0002-8615-3272
dc.contributor.orcidimecSchram, Tom::0000-0003-1533-7055
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecHoriguchi, Naoto::0000-0001-5490-0416
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage01A109
dc.source.journalJournal of Vacuum Science and Technology B
dc.source.issue1
dc.source.volume35
dc.identifier.urlhttp://avs.scitation.org/doi/full/10.1116/1.4972872
imec.availabilityPublished - imec


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