Single event latch-up: increased sensitivity from planar to FinFET

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Authors
Karp, James; Hart, Michael J.; Maillard, Pierre; Hellings, Geert; Linten, Dimitri
Conference
IEEE Nuclear & Space Radiation Effects Conference - NSREC
Title
Single event latch-up: increased sensitivity from planar to FinFET
Publication type
Proceedings paper
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