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Back-gate bias effect on UTBB-FDSOI non-linearity performance

dc.contributor.authorKazemi Esfeh, Babak
dc.contributor.authorKilchytska, Valeria
dc.contributor.authorParvais, Bertrand
dc.contributor.authorPlanes, Nicolas
dc.contributor.authorHaond, M
dc.contributor.authorFlandre, Denis
dc.contributor.authorRaskin, J-P
dc.date.accessioned2021-10-24T06:43:07Z
dc.date.available2021-10-24T06:43:07Z
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/28652
dc.sourceIIOimport
dc.titleBack-gate bias effect on UTBB-FDSOI non-linearity performance
dc.typeProceedings paper
dc.contributor.imecauthorKazemi Esfeh, Babak
dc.contributor.imecauthorParvais, Bertrand
dc.contributor.orcidimecParvais, Bertrand::0000-0003-0769-7069
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage148
dc.source.endpage151
dc.source.conference47th European Solid-State Device Research Conference - ESSDERC
dc.source.conferencedate11/09/2017
dc.source.conferencelocationLeuven Beligum
dc.identifier.urlhttp://ieeexplore.ieee.org/document/8066613/
imec.availabilityPublished - open access


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