Authors

Labie, Riet; Vandevelde, Bart; Van Meensel, Wesley; Vogeleer, Mike; Werkhoven, Daniel; Allaert, Bart; Willems, Geert

Conference

18th Int. Conf. Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems - EuroSimE

Title

In-situ monitoring of field conditions and interconnect integrity for an electronic on-board module

Publication type

Proceedings paper

Embargo date

9999-12-31