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Modeling transient electrical disturbances by inductive coupling for the ISO 7637-3 ICC test

dc.contributor.authorLambrecht, Niels
dc.contributor.authorDe Zutter, Daniel
dc.contributor.authorVande Ginste, Dries
dc.contributor.authorPues, Hugo
dc.date.accessioned2021-10-24T07:25:31Z
dc.date.available2021-10-24T07:25:31Z
dc.date.issued2017-09
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/28749
dc.sourceIIOimport
dc.titleModeling transient electrical disturbances by inductive coupling for the ISO 7637-3 ICC test
dc.typeProceedings paper
dc.contributor.imecauthorDe Zutter, Daniel
dc.contributor.imecauthorVande Ginste, Dries
dc.contributor.orcidimecVande Ginste, Dries::0000-0002-0178-288X
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage5
dc.source.conferenceInternational Symposium on Electromagnetic Compatibility - EMC EUROPE
dc.source.conferencedate4/09/2017
dc.source.conferencelocationAngers France
dc.identifier.urlhttp://ieeexplore.ieee.org/document/8094745
imec.availabilityPublished - open access
imec.internalnotesISBN 978-1-5386-0689-6


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