dc.contributor.author | Lehmann, Jonathan | |
dc.contributor.author | Parys, Wout | |
dc.contributor.author | Goncalves, Juliana | |
dc.contributor.author | Govaerts, Jonathan | |
dc.contributor.author | Goverde, Hans | |
dc.contributor.author | Baert, Kris | |
dc.contributor.author | Saelens, Dirk | |
dc.date.accessioned | 2021-10-24T07:36:58Z | |
dc.date.available | 2021-10-24T07:36:58Z | |
dc.date.issued | 2017 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/28775 | |
dc.source | IIOimport | |
dc.title | An in-depth comparison of PV modules in a BIPV facade test setup | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Govaerts, Jonathan | |
dc.contributor.orcidimec | Govaerts, Jonathan::0000-0002-8908-1198 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 6BV.3.49 | |
dc.source.conference | 33rd European Photovoltaics Science and Engineering Conference - EUPVSEC | |
dc.source.conferencedate | 25/09/2017 | |
dc.source.conferencelocation | Amsterdam The Netherlands | |
imec.availability | Published - imec | |