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Analysis of the diffusion currrent in cobalt silicided n+p junctions

dc.contributor.authorPoyai, Amporn
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorGaubas, Eugenijus
dc.contributor.authorCzerwinski, A.
dc.date.accessioned2021-10-01T08:43:21Z
dc.date.available2021-10-01T08:43:21Z
dc.date.issued1998
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2879
dc.sourceIIOimport
dc.titleAnalysis of the diffusion currrent in cobalt silicided n+p junctions
dc.typeMeeting abstract
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpageCM34
dc.source.conferenceBelgische Natuurkundige Vereniging / Société Belge de Physique: General Scientific Meeting
dc.source.conferencedate19/05/1998
dc.source.conferencelocationNamur Belgium
imec.availabilityPublished - imec


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