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Electromigration-induced drift in damascene vs. conventional interconnects: an intrinsic difference
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Authors
Proost, Joris
;
Samajdar, I.
;
Witvrouw, Ann
;
Maex, Karen
Conference
Materials Reliability in Microelectronics VIII
Title
Electromigration-induced drift in damascene vs. conventional interconnects: an intrinsic difference
Publication type
Proceedings paper
Embargo date
9999-12-31
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