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A perturbative approach to predict eye diagram degradation in differential interconnects subject to asymmetry and nonuniformity

dc.contributor.authorManfredi, Paolo
dc.contributor.authorWu, Xinglong
dc.contributor.authorGrassi, Flavia
dc.contributor.authorVande Ginste, Dries
dc.contributor.authorPignari, Sergio A.
dc.date.accessioned2021-10-24T08:40:18Z
dc.date.available2021-10-24T08:40:18Z
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/28907
dc.sourceIIOimport
dc.titleA perturbative approach to predict eye diagram degradation in differential interconnects subject to asymmetry and nonuniformity
dc.typeProceedings paper
dc.contributor.imecauthorVande Ginste, Dries
dc.contributor.orcidimecVande Ginste, Dries::0000-0002-0178-288X
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage4
dc.source.conference21th IEEE Workshop on Signal and Power Integrity - SPI
dc.source.conferencedate7/05/2017
dc.source.conferencelocationBaveno Italy
dc.identifier.urlhttp://ieeexplore.ieee.org/document/7944000/
imec.availabilityPublished - open access
imec.internalnotesISBN 978-1-5090-5616-3


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