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A full-automatic test system for characterizing wide-I/O micro-bump probe cards

dc.contributor.authorMarinissen, Erik Jan
dc.contributor.authorFodor, Ferenc
dc.contributor.authorDe Wachter, Bart
dc.contributor.authorKiesewetter, Joerg
dc.contributor.authorHill, Eric
dc.contributor.authorSmith, Ken
dc.date.accessioned2021-10-24T08:47:28Z
dc.date.available2021-10-24T08:47:28Z
dc.date.issued2017-06
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/28921
dc.sourceIIOimport
dc.titleA full-automatic test system for characterizing wide-I/O micro-bump probe cards
dc.typeProceedings paper
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.imecauthorFodor, Ferenc
dc.contributor.imecauthorDe Wachter, Bart
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.source.peerreviewyes
dc.source.beginpage812
dc.source.endpage848
dc.source.conferenceIEEE Semiconductor Wafer Test Workshop - SWTW
dc.source.conferencedate4/06/2017
dc.source.conferencelocationSan Diego, CA USA
dc.identifier.urlhttp://www.swtest.org/swtw_library/2017proc/swtw2017.html
imec.availabilityPublished - imec


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