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Analysis of Iddq failures through spectral photon emission microscopy

dc.contributor.authorRasras, Mahmoud
dc.contributor.authorDe Wolf, Ingrid
dc.contributor.authorBender, Hugo
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorMaes, Herman
dc.contributor.authorVerhaverbeke, Steven
dc.contributor.authorDe Pauw, P.
dc.date.accessioned2021-10-01T08:46:34Z
dc.date.available2021-10-01T08:46:34Z
dc.date.issued1998
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2898
dc.sourceIIOimport
dc.titleAnalysis of Iddq failures through spectral photon emission microscopy
dc.typeProceedings paper
dc.contributor.imecauthorDe Wolf, Ingrid
dc.contributor.imecauthorBender, Hugo
dc.contributor.imecauthorGroeseneken, Guido
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage877
dc.source.endpage882
dc.source.conferenceProceedings of the 9th European Symposium on Reliability of Electron Devices and Failure Physics - ESREF
dc.source.conferencedate5/10/1998
dc.source.conferencelocationCopenhagen Denmark
imec.availabilityPublished - open access
imec.internalnotesSpecial issue of Microelectronics Reliability; Vol. 38


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