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In-depth characterization of WSe2 monolayers grown by GSMBE

dc.contributor.authorMortelmans, Wouter
dc.contributor.authorEl Kazzi, Salim
dc.contributor.authorNuytten, Thomas
dc.contributor.authorCrahaij, Steven
dc.contributor.authorMeersschaut, Johan
dc.contributor.authorVanhaeren, Danielle
dc.contributor.authorLandeloos, Lien
dc.contributor.authorConard, Thierry
dc.contributor.authorHoflijk, Ilse
dc.contributor.authorBender, Hugo
dc.contributor.authorMerckling, Clement
dc.contributor.authorHeyns, Marc
dc.date.accessioned2021-10-24T09:40:37Z
dc.date.available2021-10-24T09:40:37Z
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/29026
dc.sourceIIOimport
dc.titleIn-depth characterization of WSe2 monolayers grown by GSMBE
dc.typeOral presentation
dc.contributor.imecauthorMortelmans, Wouter
dc.contributor.imecauthorNuytten, Thomas
dc.contributor.imecauthorMeersschaut, Johan
dc.contributor.imecauthorVanhaeren, Danielle
dc.contributor.imecauthorConard, Thierry
dc.contributor.imecauthorHoflijk, Ilse
dc.contributor.imecauthorBender, Hugo
dc.contributor.imecauthorMerckling, Clement
dc.contributor.imecauthorHeyns, Marc
dc.contributor.orcidimecNuytten, Thomas::0000-0002-5921-6928
dc.contributor.orcidimecMeersschaut, Johan::0000-0003-2467-1784
dc.contributor.orcidimecVanhaeren, Danielle::0000-0001-8624-9533
dc.contributor.orcidimecConard, Thierry::0000-0002-4298-5851
dc.contributor.orcidimecMerckling, Clement::0000-0003-3084-2543
dc.source.peerreviewno
dc.source.conferenceE-MRS Fall 2017
dc.source.conferencedate17/09/2017
dc.source.conferencelocationWarsaw Poland
imec.availabilityPublished - imec


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