Show simple item record

Impact of cryogenic temperature operation on static and low frequency noise behaviors of FD UTBOX nMOSFETs

dc.contributor.authorNafaa, B.
dc.contributor.authorCretu, B.
dc.contributor.authorIsmail, N.
dc.contributor.authorTouayar, O.
dc.contributor.authorSimoen, Eddy
dc.date.accessioned2021-10-24T09:55:47Z
dc.date.available2021-10-24T09:55:47Z
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/29055
dc.sourceIIOimport
dc.titleImpact of cryogenic temperature operation on static and low frequency noise behaviors of FD UTBOX nMOSFETs
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage95
dc.source.endpage98
dc.source.conferenceJoint International EUSOSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)
dc.source.conferencedate3/04/2017
dc.source.conferencelocationAthens Greece
dc.identifier.urlhttps://ieeexplore.ieee.org/document/7962610/
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
39619.pdf
Size:
3.800Mb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record