Show simple item record

Growth rate of IMC in the binary sytems of Co/Sn and Cu/Sn

dc.contributor.authorNagano, Fuya
dc.contributor.authorKajihara, Masanori
dc.contributor.authorDerakhshandeh, Jaber
dc.contributor.authorHou, Lin
dc.contributor.authorVan De Peer, Myriam
dc.contributor.authorDe Preter, Inge
dc.contributor.authorHoushmand Sharifi, Shamin
dc.contributor.authorRebibis, Kenneth June
dc.contributor.authorMiller, Andy
dc.contributor.authorBeyne, Eric
dc.contributor.authorBeyer, Gerald
dc.date.accessioned2021-10-24T09:58:22Z
dc.date.available2021-10-24T09:58:22Z
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/29059
dc.sourceIIOimport
dc.titleGrowth rate of IMC in the binary sytems of Co/Sn and Cu/Sn
dc.typeProceedings paper
dc.contributor.imecauthorNagano, Fuya
dc.contributor.imecauthorDerakhshandeh, Jaber
dc.contributor.imecauthorHou, Lin
dc.contributor.imecauthorVan De Peer, Myriam
dc.contributor.imecauthorDe Preter, Inge
dc.contributor.imecauthorHoushmand Sharifi, Shamin
dc.contributor.imecauthorRebibis, Kenneth June
dc.contributor.imecauthorMiller, Andy
dc.contributor.imecauthorBeyne, Eric
dc.contributor.imecauthorBeyer, Gerald
dc.contributor.orcidimecDerakhshandeh, Jaber::0000-0003-2448-9165
dc.contributor.orcidimecBeyne, Eric::0000-0002-3096-050X
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage3
dc.source.conferenceIEEE International Interconnect Technology Conference - IITC
dc.source.conferencedate16/07/2017
dc.source.conferencelocationHsinchu Taiwan
dc.identifier.urlhttp://ieeexplore.ieee.org/document/7968962/
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
35700.pdf
Size:
424.1Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record