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Structural characterization of CVD SnS layers

dc.contributor.authorNalin Mehta, Ankit
dc.contributor.authorZhang, Haodong
dc.contributor.authorRichard, Olivier
dc.contributor.authorBender, Hugo
dc.contributor.authorDelabie, Annelies
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-24T10:02:03Z
dc.date.available2021-10-24T10:02:03Z
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/29066
dc.sourceIIOimport
dc.titleStructural characterization of CVD SnS layers
dc.typeOral presentation
dc.contributor.imecauthorNalin Mehta, Ankit
dc.contributor.imecauthorRichard, Olivier
dc.contributor.imecauthorBender, Hugo
dc.contributor.imecauthorDelabie, Annelies
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecNalin Mehta, Ankit::0000-0002-2169-940X
dc.contributor.orcidimecRichard, Olivier::0000-0002-3994-8021
dc.source.peerreviewno
dc.source.conferenceMicroscopy of Semiconducting Materials XX - MSM
dc.source.conferencedate9/04/2017
dc.source.conferencelocationOxford UK
imec.availabilityPublished - imec


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