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Enhanced model for ZTC in irradiated and strained pFinFET

dc.contributor.authorNascimento, Vinicius M.
dc.contributor.authorAgopian, Paula G.D.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorMartino, Joao A.
dc.date.accessioned2021-10-24T10:03:37Z
dc.date.available2021-10-24T10:03:37Z
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/29069
dc.sourceIIOimport
dc.titleEnhanced model for ZTC in irradiated and strained pFinFET
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage4
dc.source.conference32nd Symposium on Microelectronics Technology and Devices - SBMicro
dc.source.conferencedate28/08/2017
dc.source.conferencelocationFortaleza Brazil
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8113016/
imec.availabilityPublished - open access


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