dc.contributor.author | Nuytten, Thomas | |
dc.contributor.author | Bogdanowicz, Janusz | |
dc.contributor.author | Hantschel, Thomas | |
dc.contributor.author | Schulze, Andreas | |
dc.contributor.author | Favia, Paola | |
dc.contributor.author | Bender, Hugo | |
dc.contributor.author | De Wolf, Ingrid | |
dc.contributor.author | Vandervorst, Wilfried | |
dc.date.accessioned | 2021-10-24T10:16:13Z | |
dc.date.available | 2021-10-24T10:16:13Z | |
dc.date.issued | 2017 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/29094 | |
dc.source | IIOimport | |
dc.title | Nanoscale stress measurements through advanced Raman spectroscopy | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Nuytten, Thomas | |
dc.contributor.imecauthor | Bogdanowicz, Janusz | |
dc.contributor.imecauthor | Hantschel, Thomas | |
dc.contributor.imecauthor | Favia, Paola | |
dc.contributor.imecauthor | Bender, Hugo | |
dc.contributor.imecauthor | De Wolf, Ingrid | |
dc.contributor.imecauthor | Vandervorst, Wilfried | |
dc.contributor.orcidimec | Nuytten, Thomas::0000-0002-5921-6928 | |
dc.contributor.orcidimec | Bogdanowicz, Janusz::0000-0002-7503-8922 | |
dc.contributor.orcidimec | Hantschel, Thomas::0000-0001-9476-4084 | |
dc.contributor.orcidimec | Favia, Paola::0000-0002-1019-3497 | |
dc.contributor.orcidimec | De Wolf, Ingrid::0000-0003-3822-5953 | |
dc.source.peerreview | no | |
dc.source.conference | E-MRS Spring Meeting | |
dc.source.conferencedate | 21/05/2017 | |
dc.source.conferencelocation | Strasbourg France | |
imec.availability | Published - imec | |