dc.contributor.author | O'Sullivan, Barry | |
dc.contributor.author | Ritzenthaler, Romain | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Dentoni Litta, Eugenio | |
dc.contributor.author | Schram, Tom | |
dc.contributor.author | Vaisman Chasin, Adrian | |
dc.contributor.author | Linten, Dimitri | |
dc.contributor.author | Horiguchi, Naoto | |
dc.contributor.author | Machkaoutsan, Vladimir | |
dc.contributor.author | Fazan, Pierre | |
dc.contributor.author | Li, Y | |
dc.date.accessioned | 2021-10-24T10:32:04Z | |
dc.date.available | 2021-10-24T10:32:04Z | |
dc.date.issued | 2017 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/29122 | |
dc.source | IIOimport | |
dc.title | Gate stack engineering to enhance high- $j/metal gate reliability for DRAM I/O applications | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | O'Sullivan, Barry | |
dc.contributor.imecauthor | Ritzenthaler, Romain | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.imecauthor | Dentoni Litta, Eugenio | |
dc.contributor.imecauthor | Schram, Tom | |
dc.contributor.imecauthor | Vaisman Chasin, Adrian | |
dc.contributor.imecauthor | Linten, Dimitri | |
dc.contributor.imecauthor | Horiguchi, Naoto | |
dc.contributor.imecauthor | Machkaoutsan, Vladimir | |
dc.contributor.imecauthor | Fazan, Pierre | |
dc.contributor.orcidimec | O'Sullivan, Barry::0000-0002-9036-8241 | |
dc.contributor.orcidimec | Ritzenthaler, Romain::0000-0002-8615-3272 | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.contributor.orcidimec | Schram, Tom::0000-0003-1533-7055 | |
dc.contributor.orcidimec | Vaisman Chasin, Adrian::0000-0002-9940-0260 | |
dc.contributor.orcidimec | Linten, Dimitri::0000-0001-8434-1838 | |
dc.contributor.orcidimec | Horiguchi, Naoto::0000-0001-5490-0416 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | DG-8.1 | |
dc.source.endpage | DG-8.5 | |
dc.source.conference | IEEE International Reliability Physics Symposium - IRPS | |
dc.source.conferencedate | 2/04/2017 | |
dc.source.conferencelocation | Monterey, CA USA | |
dc.identifier.url | http://ieeexplore.ieee.org/document/7936365/ | |
imec.availability | Published - open access | |