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An ultra-low power, robust photoplethysmographic readout exploiting compressive sampling, artifact reduction and sensor fusion
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Authors
Pamula Venkata, Rajesh
;
Van Hoof, Chris
;
Verhelst, Marian
;
Van Helleputte, Nick
Conference
Workshop on Advances in Analog Circuit Design - AACD
Title
An ultra-low power, robust photoplethysmographic readout exploiting compressive sampling, artifact reduction and sensor fusion
Publication type
Oral presentation
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