Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Articles
Inline discrete tomography system: Application to agricultural product inspection
Publication:
Inline discrete tomography system: Application to agricultural product inspection
Copy permalink
Date
2017
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Pereira, Luis F.Alves
;
Janssens, Eline
;
Cavalcanti, George D.C.
;
Ren, Tsang Ing
;
Van Dael, Mattias
;
Verboven, Pieter
;
Nicolai, Bart
;
Sijbers, Jan
Journal
Computers and Electronics in Agriculture
Abstract
Description
Statistics
Views
1963
since deposited on 2021-10-24
Acq. date: 2026-07-16
Citations
Statistics
Views
1963
since deposited on 2021-10-24
Acq. date: 2026-07-16
Citations