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Measurement uncertainty propagation in transistor model parameters via polynomial chaos expansion

dc.contributor.authorPetrocchi, Alessandra
dc.contributor.authorKaintura, Arun
dc.contributor.authorAvolio, Gustavo
dc.contributor.authorSpina, Domenico
dc.contributor.authorDhaene, Tom
dc.contributor.authorRaffo, Antonio
dc.contributor.authorSchreurs, Dominique
dc.date.accessioned2021-10-24T10:55:09Z
dc.date.available2021-10-24T10:55:09Z
dc.date.issued2017
dc.identifier.issn1531-1309
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/29165
dc.sourceIIOimport
dc.titleMeasurement uncertainty propagation in transistor model parameters via polynomial chaos expansion
dc.typeJournal article
dc.contributor.imecauthorSpina, Domenico
dc.contributor.imecauthorDhaene, Tom
dc.contributor.imecauthorSchreurs, Dominique
dc.contributor.orcidimecSpina, Domenico::0000-0003-2379-5259
dc.contributor.orcidimecDhaene, Tom::0000-0003-2899-4636
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage572
dc.source.endpage574
dc.source.journalIEEE Microwave and Wireless Components Letters
dc.source.issue6
dc.source.volume27
dc.identifier.urlhttp://ieeexplore.ieee.org/document/7934068/
imec.availabilityPublished - open access


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