Authors

Petrocchi, Alessandra; Kaintura, Arun; Avolio, Gustavo; Spina, Domenico; Dhaene, Tom; Raffo, Antonio; Schreurs, Dominique

ISSN

1531-1309

Issue

6

Journal

IEEE Microwave and Wireless Components Letters

Volume

27

Title

Measurement uncertainty propagation in transistor model parameters via polynomial chaos expansion

Publication type

Journal article

Embargo date

9999-12-31