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Measurement uncertainty propagation in transistor model parameters via polynomial chaos expansion
Publication:
Measurement uncertainty propagation in transistor model parameters via polynomial chaos expansion
Date
2017
Journal article
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36549.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Petrocchi, Alessandra
;
Kaintura, Arun
;
Avolio, Gustavo
;
Spina, Domenico
;
Dhaene, Tom
;
Raffo, Antonio
;
Schreurs, Dominique
Journal
IEEE Microwave and Wireless Components Letters
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1893
since deposited on 2021-10-24
Acq. date: 2025-10-25
Citations
Metrics
Views
1893
since deposited on 2021-10-24
Acq. date: 2025-10-25
Citations