Publication:

Measurement uncertainty propagation in transistor model parameters via polynomial chaos expansion

Date

2017
Journal article
Simple item page Full metadata Statistics
 
dc.contributor.authorPetrocchi, Alessandra
dc.contributor.authorKaintura, Arun
dc.contributor.authorAvolio, Gustavo
dc.contributor.authorSpina, Domenico
dc.contributor.authorDhaene, Tom
dc.contributor.authorRaffo, Antonio
dc.contributor.authorSchreurs, Dominique
dc.contributor.imecauthorSpina, Domenico
dc.contributor.imecauthorDhaene, Tom
dc.contributor.imecauthorSchreurs, Dominique
dc.contributor.orcidimecSpina, Domenico::0000-0003-2379-5259
dc.contributor.orcidimecDhaene, Tom::0000-0003-2899-4636
dc.date.accessioned2021-10-24T10:55:09Z
dc.date.available2021-10-24T10:55:09Z
dc.date.embargo9999-12-31
dc.date.issued2017
dc.identifier.issn1531-1309
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/29165
dc.identifier.urlhttp://ieeexplore.ieee.org/document/7934068/
dc.source.beginpage572
dc.source.endpage574
dc.source.issue6
dc.source.journalIEEE Microwave and Wireless Components Letters
dc.source.volume27
dc.title

Measurement uncertainty propagation in transistor model parameters via polynomial chaos expansion

dc.typeJournal article
dspace.entity.typePublication
Files

Original bundle

Name:
36549.pdf
Size:
569.63 KB
Format:
Adobe Portable Document Format
Download
Publication available in collections:
Articles