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Probing the intrinsic limitations of the contact resistance of metal/semiconductor interfaces through atomistic simulations

dc.contributor.authorPourtois, Geoffrey
dc.contributor.authorDabral, Ashish
dc.contributor.authorSankaran, Kiroubanand
dc.contributor.authorMagnus, Wim
dc.contributor.authorYu, Hao
dc.contributor.authorde Jamblinne de Meux, Albert
dc.contributor.authorLu, Augustin
dc.contributor.authorClima, Sergiu
dc.contributor.authorStokbro, Kurt
dc.contributor.authorSchaekers, Marc
dc.contributor.authorHoussa, Michel
dc.contributor.authorCollaert, Nadine
dc.contributor.authorHoriguchi, Naoto
dc.date.accessioned2021-10-24T11:20:31Z
dc.date.available2021-10-24T11:20:31Z
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/29210
dc.sourceIIOimport
dc.titleProbing the intrinsic limitations of the contact resistance of metal/semiconductor interfaces through atomistic simulations
dc.typeProceedings paper
dc.contributor.imecauthorPourtois, Geoffrey
dc.contributor.imecauthorDabral, Ashish
dc.contributor.imecauthorSankaran, Kiroubanand
dc.contributor.imecauthorMagnus, Wim
dc.contributor.imecauthorYu, Hao
dc.contributor.imecauthorClima, Sergiu
dc.contributor.imecauthorSchaekers, Marc
dc.contributor.imecauthorHoussa, Michel
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorHoriguchi, Naoto
dc.contributor.orcidimecPourtois, Geoffrey::0000-0003-2597-8534
dc.contributor.orcidimecSankaran, Kiroubanand::0000-0001-6988-7269
dc.contributor.orcidimecYu, Hao::0000-0002-1976-0259
dc.contributor.orcidimecClima, Sergiu::0000-0002-4044-9975
dc.contributor.orcidimecSchaekers, Marc::0000-0002-1496-7816
dc.contributor.orcidimecHoussa, Michel::0000-0003-1844-3515
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.contributor.orcidimecHoriguchi, Naoto::0000-0001-5490-0416
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage303
dc.source.endpage311
dc.source.conferenceSemiconductors, Dielectrics, and Metals for Nanoelectronics 15: In Memory of Samares Kar
dc.source.conferencedate1/10/2017
dc.source.conferencelocationNational Harbor, MD USA
dc.identifier.urlhttp://ecst.ecsdl.org/content/80/1/303.abstract
imec.availabilityPublished - open access
imec.internalnotesECS Transactions; Vol. 80, Iissue 1


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