dc.contributor.author | Priesol, Juraj | |
dc.contributor.author | Satka, Alexander | |
dc.contributor.author | Chvala, A. | |
dc.contributor.author | Stoffels, Steve | |
dc.contributor.author | Decoutere, Stefaan | |
dc.date.accessioned | 2021-10-24T11:26:28Z | |
dc.date.available | 2021-10-24T11:26:28Z | |
dc.date.issued | 2017-05 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/29221 | |
dc.source | IIOimport | |
dc.title | Identification of critical regions in AlGaN/GaN-on-Si Schottky barrier diode using Electron beam induced current method | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Stoffels, Steve | |
dc.contributor.imecauthor | Decoutere, Stefaan | |
dc.contributor.orcidimec | Decoutere, Stefaan::0000-0001-6632-6239 | |
dc.source.peerreview | yes | |
dc.source.conference | 41st Workshop on Compound Semiconductor Devices and Integrated Circuits - WOCSDICE | |
dc.source.conferencedate | 21/05/2017 | |
dc.source.conferencelocation | Las Palmas de Gran Canaria Spain | |
imec.availability | Published - imec | |