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Depth-resolved cathodoluminescence spectroscopy for characterization of advanced GaN-on-Si buffers

dc.contributor.authorPriesol, Juraj
dc.contributor.authorSatka, Alexander
dc.contributor.authorVisalli, Domenica
dc.contributor.authorDerluyn, Joff
dc.contributor.authorZhao, Ming
dc.contributor.authorStoffels, Steve
dc.date.accessioned2021-10-24T11:27:01Z
dc.date.available2021-10-24T11:27:01Z
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/29222
dc.sourceIIOimport
dc.titleDepth-resolved cathodoluminescence spectroscopy for characterization of advanced GaN-on-Si buffers
dc.typeProceedings paper
dc.contributor.imecauthorZhao, Ming
dc.contributor.imecauthorStoffels, Steve
dc.contributor.orcidimecZhao, Ming::0000-0002-0856-851X
dc.source.peerreviewyes
dc.source.beginpage263
dc.source.endpage266
dc.source.conference5th International Conference on Advances in Electronic and Photonic Technologies
dc.source.conferencedate19/06/2017
dc.source.conferencelocationPodbansk? Slovakia
dc.identifier.url%20Adept%202017.pdf
imec.availabilityPublished - imec


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