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dc.contributor.authorSaid, Khalid
dc.contributor.authorPoortmans, Jef
dc.contributor.authorCaymax, Matty
dc.contributor.authorLoo, Roger
dc.contributor.authorDaami, A.
dc.contributor.authorBremond, G.
dc.contributor.authorKruger, O.
dc.contributor.authorKittler, M.
dc.date.accessioned2021-10-01T08:51:06Z
dc.date.available2021-10-01T08:51:06Z
dc.date.issued1998
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2923
dc.sourceIIOimport
dc.titleHigh quality, relaxed Si1-xGex epitaxial layers for solar cell application
dc.typeOral presentation
dc.contributor.imecauthorPoortmans, Jef
dc.contributor.imecauthorCaymax, Matty
dc.contributor.imecauthorLoo, Roger
dc.contributor.orcidimecPoortmans, Jef::0000-0003-2077-2545
dc.contributor.orcidimecLoo, Roger::0000-0003-3513-6058
dc.source.peerreviewno
dc.source.conferenceE-MRS 1998 Spring Meeting; 16-19 June 1998; Strasbourg, France.
dc.source.conferencelocation
imec.availabilityPublished - imec


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