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Interface and thermal characterisation odf diamond on CMOS devices; CVD diamond on HEMT

dc.contributor.authorRamaneti, Rajesh
dc.contributor.authorKorneychuk, S.
dc.contributor.authorZhou, Y.
dc.contributor.authorAnaya, J.
dc.contributor.authorPobedinskas, Paulius
dc.contributor.authorDerluyn, J.
dc.contributor.authorVerbeeck, J.
dc.contributor.authorKuballM.,
dc.contributor.authorHaenen, Ken
dc.date.accessioned2021-10-24T11:48:27Z
dc.date.available2021-10-24T11:48:27Z
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/29260
dc.sourceIIOimport
dc.titleInterface and thermal characterisation odf diamond on CMOS devices; CVD diamond on HEMT
dc.typeOral presentation
dc.contributor.imecauthorPobedinskas, Paulius
dc.contributor.imecauthorHaenen, Ken
dc.contributor.orcidimecPobedinskas, Paulius::0000-0001-8136-5172
dc.contributor.orcidimecHaenen, Ken::0000-0001-6711-7367
dc.source.peerreviewno
dc.source.conferenceMRS Spring Meeting
dc.source.conferencedate17/04/2017
dc.source.conferencelocationPhoenix, AZ USA
imec.availabilityPublished - imec


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