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Thermal stability and switching performance metrics of top-pinned STT-MRAM devices with CMOS-compatible dual MgO MTJ stacks
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Thermal stability and switching performance metrics of top-pinned STT-MRAM devices with CMOS-compatible dual MgO MTJ stacks
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Date
2017
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Rao, Siddharth
;
Kim, Woojin
;
Couet, Sebastien
;
Swerts, Johan
;
Mertens, Sofie
;
Lin, Tsann
;
Souriau, Laurent
;
Kundu, Shreya
;
Tsvetanova, Diana
;
Crotti, Davide
;
Yasin, Farrukh
;
Sakhare, Sushil
;
Furnemont, Arnaud
;
Kar, Gouri Sankar
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1932
since deposited on 2021-10-24
Acq. date: 2025-12-16
Citations
Metrics
Views
1932
since deposited on 2021-10-24
Acq. date: 2025-12-16
Citations