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Charge transport and contact resistance characterization by the gated van der Pauw method

dc.contributor.authorRolin, Cedric
dc.contributor.authorNowack, Thomas
dc.contributor.authorMuhieddine, Khalid
dc.contributor.authorJanneck, Robby
dc.contributor.authorGenoe, Jan
dc.contributor.authorHeremans, Paul
dc.date.accessioned2021-10-24T12:22:58Z
dc.date.available2021-10-24T12:22:58Z
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/29320
dc.sourceIIOimport
dc.titleCharge transport and contact resistance characterization by the gated van der Pauw method
dc.typeMeeting abstract
dc.contributor.imecauthorRolin, Cedric
dc.contributor.imecauthorGenoe, Jan
dc.contributor.imecauthorHeremans, Paul
dc.contributor.orcidimecGenoe, Jan::0000-0002-4019-5979
dc.contributor.orcidimecHeremans, Paul::0000-0003-2151-1718
dc.source.peerreviewno
dc.source.beginpageEM01.09.07
dc.source.conferenceMaterial Research Society Fall Symposium EM01: Organic Semiconductors
dc.source.conferencedate26/11/2017
dc.source.conferencelocationBoston, MA USA
dc.identifier.urlhttps://mrsfall.zerista.com/event/member/427489?embedded=1
imec.availabilityPublished - imec


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