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Efficient physical defect model applied to PBTI in high-k stacks

dc.contributor.authorRzepa, G.
dc.contributor.authorFranco, Jacopo
dc.contributor.authorSubirats, Alexandre
dc.contributor.authorJech, M.
dc.contributor.authorVaisman Chasin, Adrian
dc.contributor.authorGrill, A.
dc.contributor.authorWaltl, M.
dc.contributor.authorKnobloch, T.
dc.contributor.authorStampfer, B.
dc.contributor.authorChiarella, Thomas
dc.contributor.authorHoriguchi, Naoto
dc.contributor.authorRagnarsson, Lars-Ake
dc.contributor.authorLinten, Dimitri
dc.contributor.authorGrasser, T.
dc.contributor.authorKaczer, Ben
dc.date.accessioned2021-10-24T12:36:30Z
dc.date.available2021-10-24T12:36:30Z
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/29343
dc.sourceIIOimport
dc.titleEfficient physical defect model applied to PBTI in high-k stacks
dc.typeProceedings paper
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorVaisman Chasin, Adrian
dc.contributor.imecauthorChiarella, Thomas
dc.contributor.imecauthorHoriguchi, Naoto
dc.contributor.imecauthorRagnarsson, Lars-Ake
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecVaisman Chasin, Adrian::0000-0002-9940-0260
dc.contributor.orcidimecChiarella, Thomas::0000-0002-6155-9030
dc.contributor.orcidimecHoriguchi, Naoto::0000-0001-5490-0416
dc.contributor.orcidimecRagnarsson, Lars-Ake::0000-0003-1057-8140
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpageXT-11.1
dc.source.endpageXT-11.6
dc.source.conferenceIEEE International Reliability Physics Symposium - IRPS
dc.source.conferencedate2/04/2017
dc.source.conferencelocationMonterey, CA USA
dc.identifier.urlhttp://ieeexplore.ieee.org/document/7936425/
imec.availabilityPublished - open access


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