Authors

Smets, Quentin; Verhulst, Anne; Simoen, Eddy; Gundlach, David; Richter, Curt; Collaert, Nadine; Heyns, Marc

ISSN

0018-9383

Issue

9

Journal

IEEE Transactions on Electron Devices

Volume

64

Title

Calibration of bulk trap-assisted tunneling and Shockley-Read-Hall currents and impact on InGaAs tunnel-FETs

Publication type

Journal article