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Calibration of bulk trap-assisted tunneling and Shockley-Read-Hall currents and impact on InGaAs tunnel-FETs

dc.contributor.authorSmets, Quentin
dc.contributor.authorVerhulst, Anne
dc.contributor.authorSimoen, Eddy
dc.contributor.authorGundlach, David
dc.contributor.authorRichter, Curt
dc.contributor.authorCollaert, Nadine
dc.contributor.authorHeyns, Marc
dc.date.accessioned2021-10-24T13:49:56Z
dc.date.available2021-10-24T13:49:56Z
dc.date.issued2017
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/29464
dc.sourceIIOimport
dc.titleCalibration of bulk trap-assisted tunneling and Shockley-Read-Hall currents and impact on InGaAs tunnel-FETs
dc.typeJournal article
dc.contributor.imecauthorSmets, Quentin
dc.contributor.imecauthorVerhulst, Anne
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorHeyns, Marc
dc.contributor.orcidimecSmets, Quentin::0000-0002-2356-5915
dc.contributor.orcidimecVerhulst, Anne::0000-0002-3742-9017
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.source.peerreviewyes
dc.source.beginpage3622
dc.source.endpage3626
dc.source.journalIEEE Transactions on Electron Devices
dc.source.issue9
dc.source.volume64
dc.identifier.urlhttp://ieeexplore.ieee.org/document/7984841/
imec.availabilityPublished - imec


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