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Correlation between radiation induced defects and lifetime degradation in high energy particle exposed float-zone silicon diodes

dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorGaubas, Eugenijus
dc.contributor.authorOhyama, Hidenori
dc.date.accessioned2021-10-01T08:55:55Z
dc.date.available2021-10-01T08:55:55Z
dc.date.issued1998
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2948
dc.sourceIIOimport
dc.titleCorrelation between radiation induced defects and lifetime degradation in high energy particle exposed float-zone silicon diodes
dc.typeMeeting abstract
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpageCM31
dc.source.conferenceBelgische Natuurkundige Vereniging / Société Belge de Physique: General Scientific Meeting
dc.source.conferencedate19/05/1998
dc.source.conferencelocationNamur Belgium
imec.availabilityPublished - imec


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