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Diode assessment of material characteristics in internally gettered and non-gettered Czochralski silicon: problems, pitfalls and guidelines
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1958 since deposited on 2021-10-01
1last month
Acq. date: 2026-05-19
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Statistics
Views
1958 since deposited on 2021-10-01
1last month
Acq. date: 2026-05-19
Citations