Publication:
Diode assessment of material characteristics in internally gettered and non-gettered Czochralski silicon: problems, pitfalls and guidelines
Date
Loading...
Files
Journal
Abstract
Description
Metrics
Views
1951 since deposited on 2021-10-01
Acq. date: 2025-10-24
Citations
Metrics
Views
1951 since deposited on 2021-10-01
Acq. date: 2025-10-24
Citations