Show simple item record

A new quality metric for III-V/high-k MOS gate stacks based on the frequency dispersion of accumulation capacitance and the CET

dc.contributor.authorVais, Abhitosh
dc.contributor.authorFranco, Jacopo
dc.contributor.authorMartens, Koen
dc.contributor.authorLin, Dennis
dc.contributor.authorSioncke, Sonja
dc.contributor.authorPutcha, Vamsi
dc.contributor.authorNyns, Laura
dc.contributor.authorMaes, Jan
dc.contributor.authorXie, Qi
dc.contributor.authorGivens, Michael
dc.contributor.authorTang, Fu
dc.contributor.authorJiang, Xiaoqiang
dc.contributor.authorMocuta, Anda
dc.contributor.authorCollaert, Nadine
dc.contributor.authorThean, Aaron
dc.contributor.authorDe Meyer, Kristin
dc.date.accessioned2021-10-24T15:26:04Z
dc.date.available2021-10-24T15:26:04Z
dc.date.issued2017
dc.identifier.issn0741-3106
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/29616
dc.sourceIIOimport
dc.titleA new quality metric for III-V/high-k MOS gate stacks based on the frequency dispersion of accumulation capacitance and the CET
dc.typeJournal article
dc.contributor.imecauthorVais, Abhitosh
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorMartens, Koen
dc.contributor.imecauthorLin, Dennis
dc.contributor.imecauthorPutcha, Vamsi
dc.contributor.imecauthorNyns, Laura
dc.contributor.imecauthorMaes, Jan
dc.contributor.imecauthorXie, Qi
dc.contributor.imecauthorGivens, Michael
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorThean, Aaron
dc.contributor.imecauthorDe Meyer, Kristin
dc.contributor.orcidimecVais, Abhitosh::0000-0002-0317-7720
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecMartens, Koen::0000-0001-7135-5536
dc.contributor.orcidimecPutcha, Vamsi::0000-0003-1907-5486
dc.contributor.orcidimecNyns, Laura::0000-0001-8220-870X
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage318
dc.source.endpage321
dc.source.journalIEEE Electron Device Letters
dc.source.issue3
dc.source.volume38
dc.identifier.urlhttp://ieeexplore.ieee.org/document/7833041/
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
35170.pdf
Size:
835.9Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record