Publication:
A new quality metric for III-V/high-k MOS gate stacks based on the frequency dispersion of accumulation capacitance and the CET
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2003 since deposited on 2021-10-24
4last month
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Acq. date: 2026-04-25
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Statistics
Views
2003 since deposited on 2021-10-24
4last month
1last week
Acq. date: 2026-04-25
Citations