Publication:
A new quality metric for III-V/high-k MOS gate stacks based on the frequency dispersion of accumulation capacitance and the CET
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1998 since deposited on 2021-10-24
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Acq. date: 2025-12-08
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Metrics
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1998 since deposited on 2021-10-24
1last month
1last week
Acq. date: 2025-12-08
Citations