Publication:
A new quality metric for III-V/high-k MOS gate stacks based on the frequency dispersion of accumulation capacitance and the CET
Date
Loading...
Files
Journal
Abstract
Description
Metrics
Views
1996 since deposited on 2021-10-24
Acq. date: 2025-10-23
Citations
Metrics
Views
1996 since deposited on 2021-10-24
Acq. date: 2025-10-23
Citations