Publication:
A new quality metric for III-V/high-k MOS gate stacks based on the frequency dispersion of accumulation capacitance and the CET
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1999 since deposited on 2021-10-24
2last month
Acq. date: 2026-01-06
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Metrics
Views
1999 since deposited on 2021-10-24
2last month
Acq. date: 2026-01-06
Citations