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Impact of processing and stack optimization on the reliability of perpendicular STT-MRAM

dc.contributor.authorVan Beek, Simon
dc.contributor.authorMartens, Koen
dc.contributor.authorRoussel, Philippe
dc.contributor.authorCouet, Sebastien
dc.contributor.authorSouriau, Laurent
dc.contributor.authorSwerts, Johan
dc.contributor.authorKim, Woojin
dc.contributor.authorRao, Siddharth
dc.contributor.authorMertens, Sofie
dc.contributor.authorLin, Tsann
dc.contributor.authorCrotti, Davide
dc.contributor.authorDegraeve, Robin
dc.contributor.authorBury, Erik
dc.contributor.authorLinten, Dimitri
dc.contributor.authorKar, Gouri Sankar
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-24T15:32:55Z
dc.date.available2021-10-24T15:32:55Z
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/29626
dc.sourceIIOimport
dc.titleImpact of processing and stack optimization on the reliability of perpendicular STT-MRAM
dc.typeProceedings paper
dc.contributor.imecauthorVan Beek, Simon
dc.contributor.imecauthorMartens, Koen
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorCouet, Sebastien
dc.contributor.imecauthorSouriau, Laurent
dc.contributor.imecauthorSwerts, Johan
dc.contributor.imecauthorKim, Woojin
dc.contributor.imecauthorRao, Siddharth
dc.contributor.imecauthorMertens, Sofie
dc.contributor.imecauthorCrotti, Davide
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorBury, Erik
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecVan Beek, Simon::0000-0002-2499-4172
dc.contributor.orcidimecMartens, Koen::0000-0001-7135-5536
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecCouet, Sebastien::0000-0001-6436-9593
dc.contributor.orcidimecSouriau, Laurent::0000-0002-5138-5938
dc.contributor.orcidimecRao, Siddharth::0000-0001-6161-3052
dc.contributor.orcidimecMertens, Sofie::0000-0002-1482-6730
dc.contributor.orcidimecBury, Erik::0000-0002-5847-3949
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage5A-1.1
dc.source.endpage5A-1.5
dc.source.conferenceIEEE International Reliability Physics symposium - IRPS
dc.source.conferencedate2/04/2017
dc.source.conferencelocationMonterey, CA USA
dc.identifier.urlhttp://ieeexplore.ieee.org/document/7936318/
imec.availabilityPublished - open access


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