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Physics of failure based quantification of life time for electronics board assemblies

dc.contributor.authorVandevelde, Bart
dc.contributor.authorLabie, Riet
dc.contributor.authorZanon, Franco
dc.contributor.authorWillems, Geert
dc.date.accessioned2021-10-24T16:59:37Z
dc.date.available2021-10-24T16:59:37Z
dc.date.issued2017-06
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/29763
dc.sourceIIOimport
dc.titlePhysics of failure based quantification of life time for electronics board assemblies
dc.typeProceedings paper
dc.contributor.imecauthorVandevelde, Bart
dc.contributor.imecauthorLabie, Riet
dc.contributor.imecauthorWillems, Geert
dc.contributor.orcidimecVandevelde, Bart::0000-0002-6753-6438
dc.contributor.orcidimecLabie, Riet::0000-0002-1401-1291
dc.contributor.orcidimecWillems, Geert::0000-0002-9137-618X
dc.source.peerreviewno
dc.source.conferenceIPC Reliability Forum
dc.source.conferencedate27/06/2017
dc.source.conferencelocationDüsseldorf Germany
imec.availabilityPublished - imec


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