dc.contributor.author | Vandooren, Anne | |
dc.contributor.author | Parvais, Bertrand | |
dc.contributor.author | Witters, Liesbeth | |
dc.contributor.author | Walke, Amey | |
dc.contributor.author | Vais, Abhitosh | |
dc.contributor.author | Merckling, Clement | |
dc.contributor.author | Lin, Dennis | |
dc.contributor.author | Waldron, Niamh | |
dc.contributor.author | Wambacq, Piet | |
dc.contributor.author | Mocuta, Dan | |
dc.contributor.author | Collaert, Nadine | |
dc.date.accessioned | 2021-10-24T17:05:44Z | |
dc.date.available | 2021-10-24T17:05:44Z | |
dc.date.issued | 2017 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/29772 | |
dc.source | IIOimport | |
dc.title | 3D technologies for analog/RF applications | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Vandooren, Anne | |
dc.contributor.imecauthor | Parvais, Bertrand | |
dc.contributor.imecauthor | Witters, Liesbeth | |
dc.contributor.imecauthor | Walke, Amey | |
dc.contributor.imecauthor | Vais, Abhitosh | |
dc.contributor.imecauthor | Merckling, Clement | |
dc.contributor.imecauthor | Lin, Dennis | |
dc.contributor.imecauthor | Waldron, Niamh | |
dc.contributor.imecauthor | Wambacq, Piet | |
dc.contributor.imecauthor | Collaert, Nadine | |
dc.contributor.orcidimec | Vandooren, Anne::0000-0002-2412-0176 | |
dc.contributor.orcidimec | Parvais, Bertrand::0000-0003-0769-7069 | |
dc.contributor.orcidimec | Vais, Abhitosh::0000-0002-0317-7720 | |
dc.contributor.orcidimec | Merckling, Clement::0000-0003-3084-2543 | |
dc.contributor.orcidimec | Wambacq, Piet::0000-0003-4388-7257 | |
dc.contributor.orcidimec | Collaert, Nadine::0000-0002-8062-3165 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 13.1 | |
dc.source.conference | IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference - IEEE S3S | |
dc.source.conferencedate | 16/10/2017 | |
dc.source.conferencelocation | San Francisco, CA USA | |
dc.identifier.url | http://ieeexplore.ieee.org/document/8308746/ | |
imec.availability | Published - open access | |