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High resolution silicon-on-insulator mid-infrared spectrometers operating at 3.3 μm

dc.contributor.authorVasiliev, Anton
dc.contributor.authorMuneeb, Muhammad
dc.contributor.authorBaets, Roel
dc.contributor.authorRoelkens, Gunther
dc.date.accessioned2021-10-24T17:22:13Z
dc.date.available2021-10-24T17:22:13Z
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/29798
dc.sourceIIOimport
dc.titleHigh resolution silicon-on-insulator mid-infrared spectrometers operating at 3.3 μm
dc.typeProceedings paper
dc.contributor.imecauthorVasiliev, Anton
dc.contributor.imecauthorMuneeb, Muhammad
dc.contributor.imecauthorBaets, Roel
dc.contributor.imecauthorRoelkens, Gunther
dc.contributor.orcidimecBaets, Roel::0000-0003-1266-1319
dc.contributor.orcidimecRoelkens, Gunther::0000-0002-4667-5092
dc.contributor.orcidimecVasiliev, Anton::0000-0002-7712-2183
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.conferenceIEEE Photonics Society Summer Topical Meeting Series
dc.source.conferencedate10/07/2017
dc.source.conferencelocationSan Juan Puerto Rico
imec.availabilityPublished - imec
imec.internalnotesISBN 978-1-5090-6571-4


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