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Deep level investigation of InGaAs on InP Layer

dc.contributor.authorWang, Chong
dc.contributor.authorSimoen, Eddy
dc.contributor.authorAlian, AliReza
dc.contributor.authorSioncke, Sonja
dc.contributor.authorCollaert, Nadine
dc.contributor.authorClaeys, Cor
dc.contributor.authorLi, Wei
dc.date.accessioned2021-10-24T18:28:28Z
dc.date.available2021-10-24T18:28:28Z
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/29894
dc.sourceIIOimport
dc.titleDeep level investigation of InGaAs on InP Layer
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorAlian, AliReza
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage4
dc.source.conferenceChina Semiconductor Technology International Conference - CSTIC
dc.source.conferencedate12/03/2017
dc.source.conferencelocationShanghai China
dc.identifier.urlhttp://ieeexplore.ieee.org/document/7919841/
imec.availabilityPublished - open access


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