Show simple item record

ESD characterization of a-IGZO TFTs on Si and foil substrates

dc.contributor.authorWang, Nian
dc.contributor.authorChen, Shih-Hung
dc.contributor.authorHellings, Geert
dc.contributor.authorMyny, Kris
dc.contributor.authorSteudel, Soeren
dc.contributor.authorScholz, Mirko
dc.contributor.authorBoschke, Roman
dc.contributor.authorLinten, Dimitri
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-24T18:31:31Z
dc.date.available2021-10-24T18:31:31Z
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/29898
dc.sourceIIOimport
dc.titleESD characterization of a-IGZO TFTs on Si and foil substrates
dc.typeProceedings paper
dc.contributor.imecauthorChen, Shih-Hung
dc.contributor.imecauthorHellings, Geert
dc.contributor.imecauthorMyny, Kris
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecHellings, Geert::0000-0002-5376-2119
dc.contributor.orcidimecMyny, Kris::0000-0002-5230-495X
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage276
dc.source.endpage279
dc.source.conference47th European Solid-State Device Research Conference - ESSDERC
dc.source.conferencedate11/09/2017
dc.source.conferencelocationLeuven Belgium
dc.identifier.urlhttp://ieeexplore.ieee.org/document/8066645/
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
35920.pdf
Size:
1.011Mb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record