Show simple item record

On-chip jitter measurement for true random number generators

dc.contributor.authorYang, Bohan
dc.contributor.authorRozic, Vladimir
dc.contributor.authorGrujic, Milos
dc.contributor.authorMentens, Nele
dc.contributor.authorVerbauwhede, Ingrid
dc.date.accessioned2021-10-24T19:34:03Z
dc.date.available2021-10-24T19:34:03Z
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/29985
dc.sourceIIOimport
dc.titleOn-chip jitter measurement for true random number generators
dc.typeProceedings paper
dc.contributor.imecauthorMentens, Nele
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage91
dc.source.endpage96
dc.source.conferenceAsian Hardware Oriented Security and Trust Symposium - AsianHOST
dc.source.conferencedate19/10/2017
dc.source.conferencelocationBeijing China
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8354001
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
41531.pdf
Size:
164.4Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record