Browsing Book chapters by author "Eyben, Pierre"
Now showing items 1-4 of 4
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Mapping conductance and carrier distributions in confined three-dimensional transistor structures
Schulze, Andreas; Eyben, Pierre; Mody, Jay; Paredis, Kristof; Wouters, Lennaert; Celano, Umberto; Vandervorst, Wilfried (2019) -
Probing semiconductor technology and devices with scanning spreading resistance microscopy
Eyben, Pierre; Vandervorst, Wilfried; Alvarez, David; Xu, Mingwei; Fouchier, Marc (2007) -
Scanning Spreading Resistance Microscopy (SSRM): High resolution 2D and 3D carrier mapping of semiconductor nanostructures
Schulze, Andreas; Eyben, Pierre; Hantschel, Thomas; Vandervorst, Wilfried (2017) -
Sub-nanometer characterization of nanoelectronic devices
Eyben, Pierre; Mody, Jay; Nazir, Aftab; Schulze, Andreas; Clarysse, Trudo; Hantschel, Thomas; Vandervorst, Wilfried (2013)