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Fundamental analysis of the collapse of nano-patterns during wet-processing of advanced interconnects
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Fundamental analysis of the collapse of nano-patterns during wet-processing of advanced interconnects
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Date
2017
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Zahedmanesh, Houman
;
Le, Quoc Toan
;
Vanstreels, Kris
;
Gonzalez, Mario
;
Tokei, Zsolt
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1917
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Acq. date: 2025-12-16
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1917
since deposited on 2021-10-24
1
last month
Acq. date: 2025-12-16
Citations