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dc.contributor.authorZografos, Odysseas
dc.contributor.authorDe Meester, Anton
dc.contributor.authorTesta, Eleonora
dc.contributor.authorSoeken, Mathias
dc.contributor.authorGaillardon, Pierre-Emmanuel
dc.contributor.authorDe Micheli, Giovanni
dc.contributor.authorAmaru, Luca
dc.contributor.authorRaghavan, Praveen
dc.contributor.authorCatthoor, Francky
dc.contributor.authorLauwereins, Rudy
dc.date.accessioned2021-10-24T20:12:16Z
dc.date.available2021-10-24T20:12:16Z
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/30038
dc.sourceIIOimport
dc.titleWave pipelining for majority-based beyond-CMOS technologies
dc.typeProceedings paper
dc.contributor.imecauthorZografos, Odysseas
dc.contributor.imecauthorTesta, Eleonora
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.imecauthorLauwereins, Rudy
dc.contributor.orcidimecZografos, Odysseas::0000-0002-9998-8009
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.contributor.orcidimecLauwereins, Rudy::0000-0002-3861-0168
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1306
dc.source.endpage1311
dc.source.conferenceDesign, Automation and Test in Europe Conference and Exhibition - DATE
dc.source.conferencedate27/03/2017
dc.source.conferencelocationLausanne Switzerland
dc.identifier.urlhttp://ieeexplore.ieee.org/document/7927195/
imec.availabilityPublished - open access


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