dc.contributor.author | Acurio Mendez, Eliana | |
dc.contributor.author | Trojman, Lionel | |
dc.contributor.author | Crupi, Felice | |
dc.contributor.author | Iucolano, Ferdinando | |
dc.contributor.author | Ronchi, Nicolo | |
dc.contributor.author | De Jaeger, Brice | |
dc.contributor.author | Bakeroot, Benoit | |
dc.contributor.author | Decoutere, Stefaan | |
dc.date.accessioned | 2021-10-25T16:30:46Z | |
dc.date.available | 2021-10-25T16:30:46Z | |
dc.date.issued | 2018 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/30064 | |
dc.source | IIOimport | |
dc.title | Reliability in GaN-based devices for power applications | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Ronchi, Nicolo | |
dc.contributor.imecauthor | De Jaeger, Brice | |
dc.contributor.imecauthor | Bakeroot, Benoit | |
dc.contributor.imecauthor | Decoutere, Stefaan | |
dc.contributor.orcidimec | Ronchi, Nicolo::0000-0002-7961-4077 | |
dc.contributor.orcidimec | De Jaeger, Brice::0000-0001-8804-7556 | |
dc.contributor.orcidimec | Bakeroot, Benoit::0000-0003-4392-1777 | |
dc.contributor.orcidimec | Decoutere, Stefaan::0000-0001-6632-6239 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 1 | |
dc.source.endpage | 6 | |
dc.source.conference | IEEE 3rd Ecuador Technical Chapters Meeting - ETCM | |
dc.source.conferencedate | 15/10/2018 | |
dc.source.conferencelocation | Cuenca Ecuador | |
dc.identifier.url | https://ieeexplore.ieee.org/document/8593328 | |
imec.availability | Published - imec | |