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Alternative metals: from ab initio screening to calibrated narrow line models

dc.contributor.authorAdelmann, Christoph
dc.contributor.authorSankaran, Kiroubanand
dc.contributor.authorDutta, Shibesh
dc.contributor.authorGupta, Anshul
dc.contributor.authorKundu, Shreya
dc.contributor.authorJamieson, Geraldine
dc.contributor.authorMoors, Kristof
dc.contributor.authorPinna, Nicolo
dc.contributor.authorCiofi, Ivan
dc.contributor.authorVan Elshocht, Sven
dc.contributor.authorBoemmels, Juergen
dc.contributor.authorBoccardi, Guillaume
dc.contributor.authorWilson, Chris
dc.contributor.authorPourtois, Geoffrey
dc.contributor.authorTokei, Zsolt
dc.date.accessioned2021-10-25T16:30:48Z
dc.date.available2021-10-25T16:30:48Z
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/30066
dc.sourceIIOimport
dc.titleAlternative metals: from ab initio screening to calibrated narrow line models
dc.typeProceedings paper
dc.contributor.imecauthorAdelmann, Christoph
dc.contributor.imecauthorSankaran, Kiroubanand
dc.contributor.imecauthorGupta, Anshul
dc.contributor.imecauthorKundu, Shreya
dc.contributor.imecauthorJamieson, Geraldine
dc.contributor.imecauthorPinna, Nicolo
dc.contributor.imecauthorCiofi, Ivan
dc.contributor.imecauthorVan Elshocht, Sven
dc.contributor.imecauthorBoemmels, Juergen
dc.contributor.imecauthorBoccardi, Guillaume
dc.contributor.imecauthorWilson, Chris
dc.contributor.imecauthorPourtois, Geoffrey
dc.contributor.imecauthorTokei, Zsolt
dc.contributor.orcidimecAdelmann, Christoph::0000-0002-4831-3159
dc.contributor.orcidimecSankaran, Kiroubanand::0000-0001-6988-7269
dc.contributor.orcidimecJamieson, Geraldine::0000-0002-6750-097X
dc.contributor.orcidimecPinna, Nicolo::0000-0003-3392-0324
dc.contributor.orcidimecCiofi, Ivan::0000-0003-1374-4116
dc.contributor.orcidimecVan Elshocht, Sven::0000-0002-6512-1909
dc.contributor.orcidimecBoccardi, Guillaume::0000-0003-3226-4572
dc.contributor.orcidimecPourtois, Geoffrey::0000-0003-2597-8534
dc.source.peerreviewyes
dc.source.beginpage154
dc.source.endpage156
dc.source.conferenceIEEE International Interconnect Technology Conference - IITC
dc.source.conferencedate4/06/2018
dc.source.conferencelocationSanta Clara, CA USA
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8456484
imec.availabilityPublished - imec


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